METHODS OF STATISTICAL MODELING OF THE RELIABILITY OF THE BASIC                                  ELEMENTS OF ELECTRONIC SYSTEMS

Ishkov Anton Sergeevich, candidate of technical sciences, associate professor, sub-department of radio engineering and electronic systems, Penza State University, senior researcher, Scientific-research Institute of electromechanical devices, ishkovanton@mail.ru
Zuev Vyacheslav Dmitrievich, candidate of technical sciences, head of the scientific-industrial complex, Scientific-research Institute of electromechanical devices

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In the design of electronic systems is performed item-evaluation of reliability indices. Applicable accelerated method for evaluating reliability based on the forced tests and methods to assess. With the help of the function describing the aging process of resistors, it is estimated storage life.

Indicators of reliability electronic components, forecasting, electronic systems, boost, tests.